NenoVision

A great couple of days at NTU FACTS Lab in Singapore. Marek Jemelka and Ondřej Novotný ran the AFM-in-SEM workshop on LiteScope, and the room brought real questions. Thank you to Dr. Lifei Xi and his team and to our distributor Asia MatteLab for hosting and organizing, and to everyone who came. 🔬

Another key study for us has been published, on which we collaborated with Umberto Celano lab. Electrical AFM has always required a back contact to complete the circuit - by cutting, metallizing, or bonding the sample. The article “Who needs an electrical back-contact after all?”, now published in the journal Nanoscale, eliminates this step. Umberto’s group at Arizona State University, in collaboration with Ondřej Novotný and Eduard Jelínek from NenoVision, replaced the physical contact with a low-energy electron beam that acts as a remote electrode. Contactless electrical mapping on 2D materials, III–V semiconductors, and complete devices, potentially at the wafer scale and without sample preparation. Full text of the article in the comments 👇 🔬 #AFM #semiconductors #defect analysis #microscopy

What we forgot to tell Eduard. 🧤 We spent weeks preparing our application engineer Eduard Jelínek for his first LiteScope installation at the Institute of Solid State Physics, University of Latvia (ISSP UL), together with our partner SIA Labochema. Internal trainings. Installation protocols. Step-by-step manuals. We covered everything. Everything, except one small detail: the system was going to be installed in a high-end cleanroom. The kind where forgetting a tool outside means going through a full re-entry procedure. Eduard found that out on-site. He didn't panic. He adapted, installed the system, delivered the training, and the customer is already sharing first results. Eduard, on behalf of the whole NenoVision team: we're sorry for the extra stress. And we're incredibly glad to have you on board. Here's to many more installations. Hopefully, with a complete briefing next time. 😄 #TeamStories #WhatWentWrong #AFM-in-SEM #LiteScope

Five conferences, three continents, from Sheffield in July to Nanjing in October. At these events, you'll find Marek Jemelka or Alex Johnson at the booth, where they'll have a model of our AFM-in-SEM system on display and plenty of answers to your questions. The goal of these meetings is to find out where AFM-in-SEM truly fits into your work - whether it's semiconductor failure analysis, energy materials development, or material science in general - and what it could measure that your current equipment cannot. Come discuss AFM-in-SEM with us and book a demo! 🔬 #AFM #SEM #defect analysis #semiconductors

Every LiteScope is built by hand. Each unit goes through hours of precise work before it ever touches a sample. It takes time to get it right. That’s kind of the point.👌 🔬 LiteScope combines AFM and SEM techniques, which both entirely changed the way we look at materials. The instrument has to be built to that standard. #AFM #SEM #microscopy

Why was LiteScope created in the first place? Jan Neuman explains it in a minute. 🎥 Today, the semiconductor industry and materials research are facing the same problem. They need to analyze samples at a precisely defined location, not just somewhere nearby. LiteScope is the answer. An atomic force microscope (AFM) that operates directly inside an electron microscope. What this means in practice: 🔬 SEM locates the exact point of interest 📊 AFM measures topography, mechanical, electrical, and magnetic properties at that same location How do you handle correlative analysis in your lab? #AFM #SEM #failureanalysis #microscopy

Jan Neuman was at Imperial College London last week. He was invited by the @CAMIE Industrial Symposium team. Not to talk about the technology, but about how NenoVision came to be. What does the journey from research at BUT to a product that people in industry and leading universities use today actually look like? What does it entail when you suddenly have to juggle science, engineering, business, and people all at once? At the heart of this story is LiteScope, An AFM right inside an SEM, with no sample transfer and no switching between instruments. You measure topography, mechanical, and electrical properties at the same time, in the same place, in a single scan. A room full of PhD students and young researchers. Exactly the people who are now standing where Jan once stood. Thanks to the CAMIE team for the invitation. 🎓 #AFM #SEM #correlativemicroscopy #nanoscale #deeptech

9,000 km. Three events. Two live demos. Countless discussions. In April, Marek Jemelka flew to Taiwan. First to Academia Sinica in Taipei, then to Hsinchu for the first EDFAS workshop ever held in Asia. In one room with NVIDIA, TSMC, and Qualcomm. Hsinchu Science Park alone is home to hundreds of companies. Taiwan makes over 90% of the world's most advanced chips. Reading that is one thing — standing in front of those fabs is another. LiteScope belongs there. Full story on the blog. 👇 #NenoVision #LiteScope #FailureAnalysis #Semiconductors

When NVIDIA, TSMC, and Qualcomm are in the room — you want to be there too. 🔬 Proud to see NenoVision among the industry leaders shaping the future of semiconductor failure analysis at the first-ever EDFAS Asia Workshop in Taiwan. Full recap in the comments 👇 #NenoVision #AFM #SEM #FailureAnalysis #Semiconductor #EDFAS

We're heading to Halle, Germany next week! On 19–20 May, the CAM Workshop — one of Europe's leading events focused on failure analysis and material diagnostics in electronics — returns to Fraunhofer Institute for Microstructure of Materials and Systems IMWS. This year, you'll find our LiteScope™ at the booth of our local partner John P. Kummer Group — stop by to see how AFM-in-SEM opens up new possibilities in semiconductor failure analysis. Marek Jemelka will be there to answer your questions and walk you through real-world applications. Curious what AFM-in-SEM looks like in practice? We recently published a detailed look at how it's being used for defect detection at the 5nm node → in comment See you in Halle! 👋 #CAMWorkshop #FailureAnalysis #Semiconductors #AFMInSEM #LiteScope #NenoVision #FraunhoferIMWS